Dual-Beam X-Ray Inspection System for Bottles, Jars and Cans Application Industry
Food in cans, bottles, jars, boxes, etc.
Dual-Beam X-Ray Inspection System for Bottles, Jars and Cans Features
1. Easy connection with existed production line
2. Glass in glass, metal in metal detection
3. High capacity and good accuracy
4. Simultaneous inspection for contaminants and filling level
5. High-speed pusher rejecter
6. Good solution for canned product
After years of solid and rapid development, Techik Instrument (Shanghai) Co., Ltd. has grown into one of the most professional and influential enterprises in China. x ray inspection food industry Today, Techik Instrument (Shanghai) Co., Ltd. ranks the top as a professional and experienced supplier in the industry. We can design, develop, manufacture, and sell different series of products on our own combining the efforts and wisdom of all our staff. Also, we are responsible for offering a wide range of services for customers including technical support and prompt Q&A services. You may discover more about our new product x ray inspection food industry and our company by directly contacting us.The product features the desired safety. It can perform tasks in hazardous environments where humans are unable to operate.
Two sets of imaging systems
Double angle cross inspection
Avoid blind inspection
Intelligent partition
Different parts can be detected with the best sensitivity.
Multiple functions
Simultaneous detection of contaminants, bottle cap, filling level and damaged packaging
High resolution detector
4-5 Times better in exposure compared with standard 0.4mm detector.
Higher sensitivity, longer service time, low radiation and maintenance cost.
Customized intelligent algorithm
High sensitivity and stability
Fast rejecter system, big capacity
High-speed push rejecter
Multi-segment rejecter system
Supporting high speed
Big touch screen
Multiple language
Automatic monitoring interface
Ethernet and USB port
Copyright © 2021 Techik Instrument (Shanghai) Co., Ltd. All Rights Reserved.