Techik will attend FIC2023, with food additives and ingredients inspection equipment!

March 13, 2023

Techik will attend FIC2023 at booth 21U67, which will take place at the National Convention and Exhibition Center in Shanghai from March 15-17. FIC is a top-notch platform for domestic and international industry exchange and development. The exhibition is divided into three major sectors: food industry raw materials, food industry machinery and equipment, and food industry innovative technology, with five exhibition areas: natural and functional products, machinery and testing instruments, comprehensive products, flavors and spices, and international exhibition area. With over 1,500 exhibitors, the event is expected to attract more than 150,000 professional visitors.


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Techik will attend FIC2023 at booth 21U67, which will take place at the National Convention and Exhibition Center in Shanghai from March 15-17. FIC is a top-notch platform for domestic and international industry exchange and development. The exhibition is divided into three major sectors: food industry raw materials, food industry machinery and equipment, and food industry innovative technology, with five exhibition areas: natural and functional products, machinery and testing instruments, comprehensive products, flavors and spices, and international exhibition area. With over 1,500 exhibitors, the event is expected to attract more than 150,000 professional visitors.

 

During the exhibition, Techik will showcase it metal detectors, X-ray inspection system and checkweighers. Automated detection and inspection for imperfect and foreign matter is necessary across the additives and ingredients industry chain, starting from raw materials to finished products. Take the Chinese herbal powder flavors as an example. The detection and sorting of Chinese herbal raw materials can help ensure the quality of the product. During processing, foreign object detection is crucial to avoid the risk of foreign objects, such as glass fragments and damaged filters, from entering the product. Techik Detection, equipped with a range of technologies and industry experience, offers detection and inspection equipment and solutions to the additives and ingredients industry. Techik provides detection and inspection solutions across the entire production process, from raw material acceptance to online processing inspection, as well as single packaging, boxing, and other production stages.

 

Techik X-ray inspection machine is capable of identifying foreign objects, product defects, underweight items, and poor sealing (such as leaking oil or inadequate sealing) to assist companies in managing product quality.

 

It is suitable for detecting metal and non-metal foreign objects in small and medium-sized packaging with low density and uniformity. This equipment continues the features of low energy consumption and compact design of the previous products in the series. Compared to its predecessor, it has faster operating speed, easier cleaning and maintenance, and lower operating costs, thus further improving cost-effectiveness.

It is suitable for products in small and medium-sized packaging, and can detect foreign objects, oil leakage, product packaging appearance, and weight. In addition to the original foreign object detection function, it also has detection capabilities for sealing leaks and sealing clamps. It can also perform visual inspection of external packaging defects (such as wrinkles at the sealing position, skewed edges, oil stains, and dirt) and weight detection.




Techik visual inspection machine can replace manual inspection of product appearance to help companies improve product quality. It is suitable for bucket-packed product inspection. It can detect defects such as damaged and irregularly folded heat-shrink film packaging. Multiple cameras distributed at different angles can perform 360-degree non-dead-angle inspection of bucket-packed products. It can achieve high-speed and high-precision heat-shrink film packaging defect detection and can also be equipped with code and character defect detection functions.


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